The symposium will be held in the framework of the XXXIX RSEF Physics Biennial will be held in Donostia/San Sebastián from July 15 to 19, 2024.

In recent years, improvements in the miniaturization and assembly processes of matter, as well as the use of novel chemical species, have placed nanotechnology as a major producer of new materials: customized organic molecules, nanowires, 2D materials and materials for energy, among others. These new materials are expected to be part of future electronic devices addressing some of humanity’s current challenges, such as electronic efficiency, energy storage, climate change and disease control. Scanning probe microscopies (SPM) play a key role in the characterization and fabrication of these materials. These techniques provide valuable information at the nanometer scale about the structure and physical properties of materials. It also enables structure-property correlations, which is crucial for understanding the behavior of materials and is a source of inspiration for the design of new ones with specific properties. In addition, SPM studies on materials can be performed in situ on working devices, such as transistors, photodetectors or batteries. This symposium will cover SPM works for the production,  characterization and test of materials for future electronics.

Organizing Committee

Daniel Martín Jiménez (ICMAB-CSIC)
Héctor González Herrero (UAM-IFIMAC)
Ana Pérez Rodríguez (USAL)

Invited speakers

Keynote speaker: Dr. Daniel Ebeling (Universidad Justus Liebig, Gießen, Germany)
Fabian Schulz (CIC nanoGUNE)
Sara Barja (Donostia International Physics Center)
Carmen Munuera (Instituto de Ciencia de Materiales de Madrid)
Eider Berganza (Madrid Institute of Materials Science)
Marc González Cuixart (Catalan Institute of Nanoscience and Nanotechnology)
AitorMugarza (Catalan Institute of Nanoscience and Nanotechnology)


División de Física de la Materia Condensada (GEFES)
Asociación Usuarios Sincrotrón España (AUSE)
Instituto de Ciencia de Materiales de Barcelona (ICMAB)