Advanced Force Microscopy and Nanolithography (ForceTool), ICMM-CSIC

Group type:  Both theory and experiment

Research description: The Advanced Force Microscopy and Nanolithography Group directed by Prof. Ricardo García has a consistent record on scientific originality and innovation in the development of nanoscale microscopies and nanolithography. Specifically, the Group is focused on several instrumental/methodology developments:

  • Advanced force microscopy methods. Bimodal AFM.
  • 3D imaging of solid-liquid interfaces.
  • Cell nanomechanics
  • Molecular imaging and molecular recognition
  • Theory of dynamic AFM
  • Oxidation Scanning Probe Lithography and nanometer-scale electronic devices

The experimental facilities in the group include state of the art AFMs such as Cypher (Asylum Research), JPK NanoWizard III with an inverted optical microscope, Multimode V and Dimension V (Bruker), Agilent 4500 (Keysight Technologies), as well as home-built bimodal AFMs.

Keywords: Advanced microscopies and spectroscopies; Mechanical and acoustical properties; Nanostructures; Two-dimensional materials; Structure of solids and liquid; Surfaces and interfaces

Affiliation: Materials Science Factory, INSTITUTO DE CIENCIA DE MATERIALES DE MADRID, CSIC

Contact: r.garcia@csic.es

 Group Members: http://www.icmm.csic.es/forcetool/people/

Webpage http://www.icmm.csic.es/forcetool/