The spatial resolution and flexibility of the atomic force microscopy (AFM) related techniques make them central in many fields of nanoscience and nanotechnology, with special emphasis in the characterization of advanced nanomaterials. It provides not only impressive topographical images down to atomic resolution but also unparalleled versatility. On top of that, it offers valuable information on different physicochemical properties of a large variety of materials and it facilitates modes which allow sample modification at the nanometer level.
This symposium aims to bring together the AFM community to present and discuss the use, development and novel applications of AFM-based techniques for the characterization of advanced nanomaterials, both from experimental and theoretical points of view. The topics of the contributions will cover the use of AFM for the study of a wide range of nanomaterials to gain insight on their electronic, electrical, optical, magnetic and mechanical properties in different environments, from ultrahigh-vacuum to ambient conditions and liquids.
– Elisa Palacios Lidón (Universidad de Murcia)
– Pablo Ares García (Universidad Autónoma de Madrid)
– Carmen Munuera López (Instituto de Ciencia de Materiales de Madrid, ICMM-CSIC)
– Miriam Jaafar Ruiz-Castellanos (Universidad Autónoma de Madrid)
– Guilherme Vilhena (Universidad Autónoma de Madrid)