The spatial resolution and flexibility of the atomic force microscopy (AFM) related techniques make them central in many fields of nanoscience and nanotechnology, with special emphasis in the characterization of advanced nanomaterials. It provides not only impressive topographical images down to atomic resolution but also unparalleled versatility. On top of that, it offers valuable information on different physicochemical properties of a large variety of materials and it facilitates modes which allow sample modification at the nanometer level.
This symposium aims to bring together the AFM community to present and discuss the use, development and novel applications of AFM-based techniques for the characterization of advanced nanomaterials, both from experimental and theoretical points of view. The topics of the contributions will cover the use of AFM for the study of a wide range of nanomaterials to gain insight on their electronic, electrical, optical, magnetic and mechanical properties in different environments, from ultrahigh-vacuum to ambient conditions and liquids.
Organizing Committee:
– Elisa Palacios Lidón (Universidad de Murcia)
– Pablo Ares García (Universidad Autónoma de Madrid)
– Carmen Munuera López (Instituto de Ciencia de Materiales de Madrid, ICMM-CSIC)
– Miriam Jaafar Ruiz-Castellanos (Universidad Autónoma de Madrid)
– Guilherme Vilhena (Universidad Autónoma de Madrid)
Program
Tuesday, July 12th
|
---|
Wednesday, July 13th
|
---|
Thursday, July 14th
|
---|
Posters
P1 | Mª Dolores Samper Madrigal (Universitat Politècnica de València) | Study of the effect of reactive/non-reactive additives on the microstructure of biopolymer blends by means of AFM-QNM |
P2 | Cristina Paola Pavon Vargas (Universitat Politècnica de València) | AFM Surface deterioration evaluation to monitor thermoplastic starch films degradation under composting conditions |
P3 | Diana Méndez Arvelo (CSIC) | Visualization of interfacial layers of organic molecules on graphite by Three-Dimensional Atomic Force Microscopy. |
P4 | Daniel Gallego Fuente (Universidad Autónoma de Madrid) | Development of a technological AFM microscope for operation in UHV |
P5 | Diego Alonso Aldave Valle (Universidad Autónoma de Madrid) | Deterministic transfer of gold nanowires in scanning probe assisted nanowire circuitries |
P6 | Eva Osuna Bris (Universidad Autónoma de Madrid) | Nano-scale conductivity of Hi3(HITP)2 Metal-Organic Framework |
P7 | Miriam Jaafar Ruiz – Castellanos (Universidad Autónoma de Madrid) | Unraveling Dissipation-Related Features in Magnetic Imaging by Bimodal Magnetic Force Microscopy |
P8 | Mario Navarro Rodríguez (Universidad de Murcia) | Charge injection and conductivity measurements on highly insulating materials |
P9 | Ana Cros (Universitat de València) | Ultraviolet light assisted Kelvin probe force microscopy of dislocations in GaN structures for power applications |
P10 | Pablo Ares García (Universidad Autónoma de Madrid) | Isolation of Highly Stable Antimonene under Ambient Conditions |
P11 | Guilherme Vilhena (Universidad Autónoma de Madrid) | All-Atom Single-Protein AFM Nanomechanical Spectroscopy Mapping |